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Conference “Sensoren und Messsysteme” (Sensors and Measurement Systems) 2010 to be held Parallel to SENSOR+TEST in Nürnberg
Collaboration between AMA Association, VDE/ITG and VDI/VDE-GMA
The Information Technology Society, VDE/ITG, the Society for Measurement and Automatic Control, VDI/VDE-GMA, and AMA Association for Sensor Technology have agreed to conduct the biannual professional conference “Sensoren und Messsysteme” (Sensors and Measurement Systems) within the framework of the SENSOR+TEST trade exhibition. 2010 the conference will be organized by VDE/ITG, where ITG is the technical agent.
“Our conference will clearly benefit from its attachment to the most important exhibition for measurement technology in Europe” says Prof. Dr. Reimund Gerhard, University of Potsdam, scientific chairman for the conference in 2010. Prof. Dr. Gerald Gerlach, Technical University of Dresden, is alternating chairman for those years when the event is organized by VDI/VDE-GMA. He is likewise pleased: “Together, this conference and the traditional conferences of SENSOR+TEST complement each other ideally and we expect significant synergy effects for all participants.” Also satisfied are Prof. Dr. Roland Werthschützky, Technical University of Darmstadt, and Prof. Dr. Reinhard Lerch, University of Erlangen-Nürnberg, both chairmen of the biannual SENSOR conference, which is held in the odd-numbered years: “Nürnberg is now definitely a fixed in the calendar of all sensor experts” says Prof. Dr. Roland Werthschützky, and his colleague Prof. Dr. Reinhard Lerch adds: “We are convinced that this new arrangement will have a positive effect on all participating parties.”
For 30 years, VDE/ITG and VDI/VDE-GMA have been biannually alternately conducting the conference “Sensors and Measurement Systems”, which is considered to be the most important German scientific event in the field of sensors. The conference focuses on sensors and sensor systems for industrial applications. This relates to areas such as mass-market sensors, RFIDs, automotive sensors, MEMS, energy self-sufficient sensors, and nano-scale sensors. Furthermore, newest developments in “classic” sensor and measurement system areas are also reviewed.
This year, the trade fair SENSOR+TEST will be carried out for its 15th time. It is considered to be the most important forum in the industry for the sensors and measurement and test technology. From its first appearance on, it has always been accompanied by international scientific conferences. In the forefront stood the SENSOR conference and the two yearly alternating conferences OPTO (Optical Technologies in Sensor- and Measurement Engineering) and IRS2 (Infrared Sensors and Systems). Starting 2009, these three conferences will be held together and alternate yearly with “Sensors and Measurement Systems”.
