S.01.02.01 Force, load
S.01.02.02 Mass, weight, dosage
S.01.02.03 Stress, strain, elongation
S.01.02.04 Pressure, absolute
S.01.02.05 Pressure (gauge) – measuring error < 0.1 %
S.01.02.06 Pressure (gauge) – measuring error ≥ 0.1 %
S.01.02.19 Torque
S.01.04.01 Temperature, with contact
S.01.05.01 Humidity, relative (gas humidity)
S.01.05.02 Humidity, absolute (gas humidity), dew point
S.02.01 Strain gauge
S.02.03 Resistive sensor element
S.02.04 Piezoresistive sensing element
S.02.05 Thin film measuring cell
S.02.07 Thermoresistor
S.02.48 Further sensors and sensing elements
D.01.02.04.02 Mechanical parameter
D.01.02.04.04 Thermal parameter
D.01.02.04.07 Meteorological parameter
D.01.02.04.17 Mass, weight, weighting, dosing
D.01.02.06.13 Electrical resistor
D.01.02.08.02 Thin film technology
D.01.02.08.08 Microstructuring of silicon
D.01.02.08.09 Micro Systems Technologies MST, Micro-Electro-Mechanical-Systems MEMS
D.01.02.08.10 Microstructuring of other material (glas, ceramic, metal, polymer)
D.02.01 Strain gauge technology
D.02.03 Thin film technology
D.02.11 Microsystems technology MST / Micro-Electro-Mechanical-Systems MEMS
D.02.27 Laser processing
D.02.41 Other services concerning sensor systems and actuators
D.02.43 Prototype manufacture
D.02.51 Multilayer coating
D.04.15 Technology consulting
D.04.21 Studies and expert reports